IGBT / SIC HIGH-TEMP HANDLER
High-temperature testing,
without losing control.
Automatic handling, heating, electrical testing and vision inspection for IGBT and SiC devices.
RT300°C
RT–180°CPREHEAT
RT–300°CTEST
±3°CACCURACY
60 UPHAT 55S CYCLE
SYSTEM OVERVIEW
Designed for controlled,
repeatable high-temp tests.
01Automatic loading and unloading
02Dual ISO environment
03AC / DC electrical testing
04Vision defect inspection
KEY SPECIFICATIONS
Operating window
| Preheat | RT–180°C |
|---|---|
| Test temperature | RT–300°C |
| Accuracy | ±3°C |
| Throughput | 60 UPH @ 55s |
INLINE INTELLIGENCE
Inspection before
and after test.
LocateInspectJudge
TECHNICAL RESOURCES
Documents matched
to your application.
Submit device type, test temperature and target cycle time. An engineer will prepare the relevant specification and proposal.
Request technical file →POWER DEVICE TESTING